APS Logo

Gating graphene with a semiconductor

ORAL

Abstract

Metals are commonly used as electrostatic gates in devices due to their abundant charge carrier densities that are necessary for efficient charging and discharging. A semiconducting gate can be beneficial for certain fabrication processes, in low light conditions, and for specific gating properties. Here, we determine the effectiveness and limitations of a semiconducting gate in graphene and bilayer graphene devices. Using the semiconducting transition metal dichalcogenides molybdenum disulfide (MoS2) and molybdenum diselenide (MoSe2), we show that these semiconductors can be used to suitably gate the graphene devices for certain operating conditions. For singly gated devices, we find that the semiconducting gates provide gating characteristics comparable with metallic gates below liquid helium temperatures but include resistivity features resulting from gate voltage clamping of the MoS2. A 1D potential model is developed that corroborates the clamping effect observed in the measurements. In doubly gated devices, we pin down the parameter range of effective operation and show that the semiconducting depletion regime results in clamping and hysteresis from defect state charge trapping. Our results provide a guide for the appropriate operating conditions for employing semiconducting gates and open the door to novel device architectures.

Publication: Preprint: Randy Sterbentz, , Bogyeom Kim, Anayeli Flores-Garibay, Kristine L. Haley, Nicholas T. Pereira, Kenji Watanabe, Takashi Taniguchi, Joshua O. Island. "Gating graphene with a semiconductor." (2024). <https://arxiv.org/abs/2410.06432>

Presenters

  • Randy M Sterbentz

    University of Nevada, Las Vegas

Authors

  • Randy M Sterbentz

    University of Nevada, Las Vegas

  • Kristine L Haley

    University of Nevada, Las Vegas

  • Joshua O Island

    University of Nevada, Las Vegas

  • Kenji Watanabe

    National Institute for Materials Science, NIMS, Research Center for Functional Materials, National Institute for Materials Science, Research Center for Electronic and Optical Materials, National Institute for Materials Science, 1-1 Namiki, Tsukuba 305-0044, Japan, Research Center for Functional Materials, National Institute of Material Science, Tsukuba, Japan, National Institute of Materials Science, Advanced Materials Laboratory, National Institute for Materials Science

  • Takashi Taniguchi

    National Institute for Materials Science, International Center for Materials Nanoarchitectonics, National Institute for Materials Science, Research Center for Materials Nanoarchitectonics, National Institute for Materials Science, 1-1 Namiki, Tsukuba 305-0044, Japan, International Center for Materials Nanoarchitectonics, National Institute of Material Science, Tsukuba, Japan, Advanced Materials Laboratory, National Institute for Materials Science

  • Bogyeom Kim

    University of Nevada, Las Vegas

  • Nicholas T Pereira

    University of Nevada, Las Vegas

  • Anayeli Flores-Garibay

    University of Nevada, Las Vegas