Acceptor-donor complexes in Ga<sub>2</sub>O<sub>3</sub>
ORAL
Abstract
Ga2O3 has attracted great attention as a promising material for high power electronic devices due to a very large band gap and high breakdown voltage, with high Baliga’s figure of merit. Ga2O3 can be easily doped n-type, with Si, Ge, or Sn as shallow donors, but difficult to dope p-type. All tested candidate acceptor impurities lead to deep acceptor levels, lying at ~1 eV above the valence band. These deep acceptors are still useful for making Ga2O3 semi-insulating, adding flexibility to device design, and the interactions between acceptors, such as nitrogen, and donors may play important role in making Ga2O3 semi-insulating. Using electronic structure calculations based on hybrid density functional theory, we investigate the interactions between acceptor and donor impurities in different possible configurations of acceptor-donor complexes considering all the inequivalent cation and anion sites of the β-Ga2O3 crystal structure. We calculate binding energies of the complexes, and discuss changes in transition levels compared to those of the isolated species. These results aim at facilitating the experimental characterization of acceptor impurities to further the development of Ga2O3-based electronic devices.
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Presenters
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Intuon Chatratin
Materials Science and Engineering, University of Delaware
Authors
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Intuon Chatratin
Materials Science and Engineering, University of Delaware
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Fernando Pereira Sabino
Materials Science and Engineering, University of Delaware
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Pakpoom Reunchan
Physics, Kasetsart University
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Anderson Janotti
2- Department of Materials Science and Engineering, University of Delaware, University of Delaware, Materials Science and Engineering, University of Delaware, Department of Materials Science and Engineering, University of Delaware, Department of Materials Science & Engineering, University of Delaware