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2 μm-wavelength laser pulses on tin microdroplets for nanolithography: properties of the plasma and emitted ions

ORAL

Abstract

The properties of an extreme ultraviolet (EUV) source driven by hundreds-of-nanoseconds-long laser pulses of λ_laser = 2 µm wavelength are investigated through radiation-hydrodynamic simulations. A time-integrated EUV source is imaged by taking an Abel transform of the local net in-band (13.5 nm +/- 1%) emissivity, revealing a bright focus point with a lower-intensity 'tail' due to the ablation-induced motion of the droplet. Ion emissions are studied with two types of simulations: first a 'short pulse' (27 ns-long) case with laser intensity I_laser ∼ 10^11 W cm^-2 that can be readily benchmarked with present experimental systems. Then, a 'long pulse' case is studied, in which the droplet is irradiated until it is fully vaporized, which takes ∼150 ns. The kinetic energy-resolved ion spectra in both cases feature a high-energy peak on the order of keVs. At lower kinetic energies the spectra are substantially different: the short pulse spectrum exhibits much higher ion numbers due to plasma cooling at the end of the pulse, which is not present in the long pulse case.

Publication: S. J. J. de Lange, D. J. Hemminga, Y. Mostafa, R. A. Meijer, O. O. Versolato, and J. Sheil, "Modeling the hundreds-of-nanoseconds-long irradiation of tin droplets with a 2 μm-wavelength laser for future EUV lithography," Plasma Sources Sci. Technol. 33, 105003 (2024).<br>S. J. J. de Lange, J. Gonzalez, D. J. Engels, F. M. Kohlmeier, and J. Sheil, "Ion emission properties from tin plasmas generated by 2 μm-wavelength laser pulses," submitted manuscript

Presenters

  • Stan J de Lange

Authors

  • Stan J de Lange

  • John Sheil

    ARCNL/VU

  • Oscar Versolato

    Advanced Research Center for Nanolithography

  • Diko J Hemminga

    ARCNL

  • Yahia Mostafa

    ARCNL

  • Randy A Meijer

    ARCNL

  • Dion Engels

    Advanced Research Center for Nanolithography

  • Felix M Kohlmeier

    ARCNL