2 μm-wavelength laser pulses on tin microdroplets for nanolithography: properties of the plasma and emitted ions

ORAL

Abstract

The properties of an extreme ultraviolet (EUV) source driven by hundreds-of-nanoseconds-long laser pulses of λ_laser = 2 µm wavelength are investigated through radiation-hydrodynamic simulations. A time-integrated EUV source is imaged by taking an Abel transform of the local net in-band (13.5 nm +/- 1%) emissivity, revealing a bright focus point with a lower-intensity 'tail' due to the ablation-induced motion of the droplet. Ion emissions are studied with two types of simulations: first a 'short pulse' (27 ns-long) case with laser intensity I_laser ∼ 10^11 W cm^-2 that can be readily benchmarked with present experimental systems. Then, a 'long pulse' case is studied, in which the droplet is irradiated until it is fully vaporized, which takes ∼150 ns. The kinetic energy-resolved ion spectra in both cases feature a high-energy peak on the order of keVs. At lower kinetic energies the spectra are substantially different: the short pulse spectrum exhibits much higher ion numbers due to plasma cooling at the end of the pulse, which is not present in the long pulse case.

Publication: S. J. J. de Lange, D. J. Hemminga, Y. Mostafa, R. A. Meijer, O. O. Versolato, and J. Sheil, "Modeling the hundreds-of-nanoseconds-long irradiation of tin droplets with a 2 μm-wavelength laser for future EUV lithography," Plasma Sources Sci. Technol. 33, 105003 (2024).
S. J. J. de Lange, J. Gonzalez, D. J. Engels, F. M. Kohlmeier, and J. Sheil, "Ion emission properties from tin plasmas generated by 2 μm-wavelength laser pulses," submitted manuscript

Presenters

  • Stan J de Lange

Authors

  • Stan J de Lange

  • John Sheil

    ARCNL/VU

  • Oscar Versolato

    Advanced Research Center for Nanolithography

  • Diko J Hemminga

    ARCNL

  • Yahia Mostafa

    ARCNL

  • Randy A Meijer

    ARCNL

  • Dion Engels

    Advanced Research Center for Nanolithography

  • Felix M Kohlmeier

    ARCNL