First Characterization of RF Plasma Jet Using Spatially-Resolved OES and Fast-Sweeping Langmuir Diagnostics

A new RF plasma facility, ARCTRON, has been developed to simulate low-enthalpy atmospheric re-entry environments for advanced material testing and plasma diagnostics. In this presentation, we report on the first plasma characterization campaign conducted within ARCTRON. Spatially resolved optical emission spectroscopy (OES) was performed using a two-axis linear translation stage, enabling measurement of excitation and electron temperatures across both axial and radial profiles of the plasma jet. To validate these spectroscopic measurements, a fast-sweeping Langmuir probe system was implemented to independently determine electron density and temperature. This dual-diagnostic approach provides a comprehensive assessment of the plasma properties within ARCTRON, establishing a foundation for future materials exposure campaigns and facility benchmarking. Preliminary results will be presented and discussed in the context of low-temperature re-entry plasma simulation.