APS Logo

System Stability Optimization and Gate Operations in a Compact Cryogenic Ion Trap Setup

POSTER

Abstract

We describe one- and two-qubit operations in a compact ion trapping system at cryogenic temperature. A low-vibration closed-cycle cryostat is utilized with all optics mounted on machined plates for operations with higher stability. We use Sandia High-Optical Access (HOA) surface traps and install the trap into a compact package, enabling easier system integration and characterization. The surface trap is mounted on a ceramic pin grid array (CPGA) package and covered with a copper lid with a meandering channel for differential pumping. The whole package is cooled down to a base temperature of 7K. We set up a Michelson interferometer to characterize and optimize the vibrations from the cryostat to the ion trap with respect to control lasers and give a quantitative analysis on the effect of vibrations on gate fidelity. We show the latest result of M{\o}lmer-S{\o}rensen gate fidelity with an analysis of the source of errors, which are dominated by motional decoherence.

Authors

  • Zhubing Jia

    Department of Physics, Duke University

  • Robert Spivey

    Department of Electrical Engineering, Duke University, Department of Electrical and Computer Engineering, Duke University

  • Ismail Inlek

    Department of Electrical Engineering, Duke University, Department of Electrical and Computer Engineering, Duke University

  • Ke Sun

    Department of Physics, Duke University

  • Stephen Crain

    Department of Electrical Engineering, Duke University, Department of Electrical and Computer Engineering, Duke University

  • Mark Kuzyk

    Department of Electrical and Computer Engineering, Duke University

  • Rachel Noek

    Department of Electrical Engineering, Duke University, Department of Electrical and Computer Engineering, Duke University

  • Kenneth Brown

    Department of Electrical Engineering, Duke University, Duke University, Department of Electrical and Computer Engineering, Duke University, Department of Electrical and Computer Engineering and Department of Physics, Duke University

  • Jungsang Kim

    Department of Electrical Engineering, Duke University, Department of Electrical and Computer Engineering and Department of Physics, Duke University