In Situ Measurement of Crystallization and Volatile Phase Transition in Niobium Dioxide Memristive Materials
ORAL
Abstract
Crystalline niobium dioxide has a volatile memristive phase change that occurs ∼800 °C that makes it an ideal candidate for future neuromorphic electronics. In this talk, I will discuss some of our recent work understanding synthesis and post-deposition annealing strategies for crystallizing this material. Specifically, we developed a straightforward optical system that operates on a horizontal tube furnace for in situ spectral measurements as an as-grown Nb2O5 film is annealed and ultimately crystallizesas NbO2. The system is based on an automated filter wheel apparatus that has 1in narrow band optical filters spanning 900nm - 1650nm. The system measures the changing spectral transmissivity of Nb2O5 as it undergoes both reduction and crystallization processes. The system was designed and built by undergraduate students, and uses a python-based control system that runs on a Raspberry Pi microcontroller. After annealing, the material properties of the Nb2O5 and NbO2 were assessed via X-ray photoelectron spectroscopy, X-ray diffraction, and 4-point resistivity, confirming that we have made crystalline NbO2.
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Publication: Measurement of the Crystallization and Phase Transition of Niobium Dioxide Thin-Films Using a Tube Furnace Optical Transmission System. Accepted for publication with AIP Advances. <br>Arxiv submission: https://arxiv.org/abs/2406.13523
Presenters
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Zachary R Robinson
University of Rochester
Authors
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Zachary R Robinson
University of Rochester
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Karsten Beckmann
NYCreates, NYcreats
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James H. Michels
SUNY Brockport
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Vincent Daviero
SUNY Brockport
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Fiona Lorenzen
Ithaca College
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Matthew C Sullivan
Ithaca College
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Nathaniel Cady
SUNY Albany, University at Albany
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Alexander C Kozen
University of Vermont
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Jeffrey M Woodward
U.S. Naval Research Laboratory
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Marc Currie
U.S. Naval Research Laboratory