Extended Depth of Focus Metalenses for Optical Computing

Extended Depth of Focus (EDOF) metalenses represent a breakthrough in optical computing by enhancing the performance of imaging and data processing systems. These metalenses, designed using subwavelength nanostructures, enable the manipulation of light across a broad range of focal depths, overcoming the limitations of traditional lenses that suffer from limited depth of field. In optical computing, where precise light manipulation and extended focal regions are critical, EDOF metalenses provide significant advantages. By ensuring consistent focus over extended ranges, these metalenses reduce the need for complex mechanical adjustments, increase system efficiency, and improve imaging clarity for fast, high-precision data processing. This talk explores the principles behind EDOF metalenses, their fabrication techniques, and their integration into optical computing systems, highlighting their potential to revolutionize applications such as real-time imaging, light-based computation, and machine vision.