Ab initio Structure Determination of Polycrystalline Materials Using 4D-STEM
ORAL
Abstract
Accurate atomic structures are important for understanding a material’s structure-property relationships. Crystallographic methods such as X-ray diffraction, 3D electron diffraction, and serial crystallography are the most effective methods for determining atomic arrangements in crystals. However, their application is limited for materials with multiple domains containing faults, grain boundaries, and intergrowths of multiple crystalline phases. 4D-STEM is the only technique that forms a small enough beam that gets rastered across the crystal to simultaneously collect spatially resolved diffraction data from nano-sized regions. This enables the use of customizable in silico apertures to localize coherently diffracting domains. By combining 4D-STEM with tomographic crystallography, we demonstrate the determination of the atomic structure of polycrystalline zeolites intergrown with multiple crystalline phases and for volumetric reconstruction of each phase, mapping their distribution within the crystal.
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Presenters
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Jungyoun Cho
University of California Los Angeles, University of California, Los Angeles, California NanoSystems Institute (CNSI), University of California, Los Angeles, California 90095, USA, California NanoSystems Institute (CNSI), University of California
Authors
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Jungyoun Cho
University of California Los Angeles, University of California, Los Angeles, California NanoSystems Institute (CNSI), University of California, Los Angeles, California 90095, USA, California NanoSystems Institute (CNSI), University of California
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Ambarneil Saha
LBNL, Lawrence Berkeley National Laboratory
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Peter Ercius
LBNL, Lawrence Berkeley National Laboratory, Lawrence Berkeley national laboratory
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Matthew H Mecklenburg
University of California Los Angeles