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FIAP Award & Industry Fellows

INVITED · MAR-Q08 · ID: 3252761







Presentations

  • Nanoelectronics and Metrology

    ORAL · Invited

    Presenters

    • Curt A Richter

      National Institute of Standards and Technology (NIST), Physical Measurement Laboratory, National Institute of Standards and Technology

    Authors

    • Curt A Richter

      National Institute of Standards and Technology (NIST), Physical Measurement Laboratory, National Institute of Standards and Technology

    View abstract →

  • Invited Talk

    ORAL · Invited

    Presenters

    • David H Chow

      HRL Laboratories, LLC

    Authors

    • David H Chow

      HRL Laboratories, LLC

    View abstract →

  • Invited Talk

    ORAL · Invited

    Presenters

    • Tahir Ghani

      Intel Corporation

    Authors

    • Tahir Ghani

      Intel Corporation

    View abstract →