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Hardware Development in Scanning Probe Microscopy

ORAL · MAR-N39 · ID: 3090129

Presentations

  • Differential Magnetic Force Microscopy with a Switchable Tip

    ORAL

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    Publication: Differential Magnetic Force Microscopy with a Switchable Tip, manuscript in preparation

    Presenters

    • Shobhna Misra

      ETH Zurich

    Authors

    • Shobhna Misra

      ETH Zurich

    • Christian L Degen

      ETH Zurich

    • Alexander Eichler

      Laboratory for Solid State Physics, ETH Zürich, ETH Zurich

    View abstract →

  • LiNbO<sub>3</sub> Resonators for High Resolution AFM

    ORAL

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    Publication: We plan on submitting this work for publication pending additional measurements.

    Presenters

    • Collin R Sanborn

      University of California, Berkeley

    Authors

    • Collin R Sanborn

      University of California, Berkeley

    • feng wang

      University of California, Berkeley

    • Eric Y. Ma

      University of California, Berkeley

    • Alp Sipahigil

      University of California Berkeley, University of California, Berkeley, University of California, Berkeley and Lawrence Berkeley National Laboratory

    • Jianghan Xiao

      University of California, Berkeley

    View abstract →

  • Small lab-size closed-cycle low temperature SPM with magnetic field

    ORAL

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    Presenters

    • Juergen Koeble

      Scienta-Omicron GmbH

    Authors

    • Andrew J Yost

      Scienta Omicron Inc., Scienta-Omicron Inc.

    • Juergen Koeble

      Scienta-Omicron GmbH

    • Bill Gerace

      Scienta Omicron Inc., Scienta Omicron, Inc.

    • Bernd Guenther

      Scienta-Omicron GmbH

    • Albrecht Feltz

      Scienta-Omicron GmbH

    View abstract →

  • AFM-SEM-EDS Correlative Microscopy in Materials Scienc

    ORAL

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    Publication: [1] A. Alipour et al. "A highly Integrated AFM-SEM Correlative Analysis Platform", Microscopy Today 31 (2023), p. 17-22.<br>[2] Kerim Arat, Hamed Alemansour, Andreas Aman, Luis Montes, Jeffrey Gardiner, Chris H Schwalb, Lukas Stühn, Marion Wolff, Sebastian Seibert, Stefano Spagna, A New Correlative Microscopy Platform Integrating AFM with in situ SEM, Microscopy and Microanalysis, Volume 29, Issue Supplement_1, 1 August 2023, Pages 1944–1945<br>[3] M. Brugger-Hatzl, R. Winkler, L. M. Seewald, D. Kuhness, S. Barth, C. Schwalb, H. Frerichs, H. Plank, "3D Nanoprinting of Advanced Nanoprobes for Correlative AFM-SEM Characterization", Scientific Innovation and convergence through Microscopy Platform (pp. 0106).<br>[4] Arat, Kerim T., et al. "Nanoparticle Characterization within Situ AFM-SEM-EDS." <br>Microscopy and Microanalysis 30. Supplement_1 (2024).

    Presenters

    • Jost Diederichs

      Quantum Design Inc.

    Authors

    • Jost Diederichs

      Quantum Design Inc.

    • Stefano Spagna

      Quantum Design Inc.

    View abstract →

  • 1K Optics-combined scanning tunneling microscope

    ORAL

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    Presenters

    • Won-Jun Jang

      Center for Quantum nanoscience

    Authors

    • Won-Jun Jang

      Center for Quantum nanoscience

    • FARAHI SHANDIZ Pegah

      Center for Quantum nanoscience

    • Jiyoon LEE

      Center for Quantum nanoscience

    • Alexina OLLIER

      Center for Quantum nanoscience

    • Lei Fang

      Center for Quantum nanoscience, Center for Quantum Nanoscience, Institute for Basic Science, Seoul 03760, Korea, Center for Quantum Nanoscience

    • Magda GRZESZCZYK

      Center for Quantum nanoscience

    • Minsu SEO

      Center for Quantum nanoscience

    • Soonhyeong LEE

      Center for Quantum nanoscience

    • Sangwon YOON

      Center for Quantum nanoscience

    • Andreas HEINRICH

      Center for Quantum nanoscience

    View abstract →