Scalable, high-fidelity all-electronic control of trapped-ion qubits
ORAL
Abstract
The central challenge of quantum computing is implementing high-fidelity quantum gates at scale. However, many existing approaches to qubit control suffer from a scale-performance trade-off, impeding progress towards the creation of useful devices. Here, we present a vision for an electronically controlled trapped-ion quantum computer that alleviates this bottleneck. Our architecture utilizes shared current-carrying traces and local tuning electrodes in a microfabricated chip to perform quantum gates with low noise and crosstalk regardless of device size. To verify our approach, we experimentally demonstrate low-noise site-selective single- and two-qubit gates in a seven-zone ion trap that can control up to 10 qubits. We implement electronic single-qubit gates with 99.99916(7)% fidelity, and demonstrate consistent performance with low crosstalk across the device. We also electronically generate two-qubit maximally entangled states with 99.97(1)% fidelity and long-term stable performance over continuous system operation. These state-of-the-art results validate the path to directly scaling these techniques to large-scale quantum computers based on electronically controlled trapped-ion qubits.
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Publication: https://doi.org/10.48550/arXiv.2407.07694
Presenters
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David Thomas Charles Allcock
Oxford Ionics
Authors
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David Thomas Charles Allcock
Oxford Ionics
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Clemens M Löschnauer
Oxford Ionics
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Jacopo Mosca Toba
Oxford Ionics
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Amy C Hughes
Oxford Ionics
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Steven King
Oxford Ionics
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Marius Weber
Oxford Ionics
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Raghavendra Srinivas
Oxford Ionics
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Roland Matt
Oxford Ionics
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Rustin Nourshargh
Oxford Ionics
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R. Tyler Sutherland
Oxford Ionics
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Chris J Ballance
Oxford Ionics
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Clemens Matthiesen
Oxford Ionics, Institute of Physics
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Maciej Malinowski
Oxford Ionics
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Thomas P Harty
Oxford Ionics