Advancing ARPES capabilities for 2D materials at BL5 of Stanford Synchrotron Radiation Lightsource

Angle-resolved photoemission spectroscopy (ARPES) is a powerful technique for probing the electronic properties of two-dimensional (2D) materials and their heterostructures, offering insights into their band structure and quasiparticle dynamics. To enhance the capabilities of beamline 5 (BL5) at the SLAC Stanford Synchrotron Radiation Lightsource (SSRL) for high-resolution ARPES measurements of 2D materials at low temperatures, we have implemented several key modifications. These include in-situ exfoliation of 2D materials on various substrates and the integration of a long working distance microscope directly on the ARPES chamber for identifying sample thicknesses. Additionally, we are developing in-situ strain engineering and operando gating techniques to tune the electronic properties of 2D materials during measurement. Our modifications aim to provide more approaches for investigating the electronic structures of 2D materials, overcoming existing challenges, and enabling comprehensive studies that leverage the high energy resolution and low temperature capabilities of SSRL BL5.