Point and Line Defects in Checkerboard Patterned Hybrid Nematic Films. A Computer Simulation Investigation

We consider a nematic liquid crystal film confined to a flat cell with homeotropic and planar-patterned hybrid anchoring, similar to a chessboard pattern, with alternating square domains featuring uniform and random anchoring. By employing Monte Carlo simulations, it was feasible to demonstrate the system's capability to stabilize line and point defects. Our results show that the interplay between domain size, anchoring conditions, and system size plays a crucial role in determining the types of defects that emerge. The simulations show only line defects when the individual domains are small enough, but also point defects when the domain size is significantly larger than the sample thickness. In the latter case, defect lines are not observed in domains with random surface anchoring, although lines and points are connected by a ``thick line'', which separates two regions with different director tilt. These findings can be valuable for designing and manipulating liquid crystal systems for various applications, from displays to advanced materials.