Metrology for quantum photonics technologies

Single-photon emitters and detectors are essential components in quantum photonics for the processing and transmission of quantum information. Quantum photonic integrated circuits, devices which incorporate single-photon sources, detectors and optical components on a single device, will be implemented in future quantum communications and information technology architectures. By incorporating components for the verification and validation of system performance into chip designs, these disruptive technologies could be reliably deployed in the field. One method of characterizing a single-photon source is to measure the optical power of the emitted photons, which can then be applied to system characterization within an integrated quantum photonics platform. To this end, this presentation will discuss the development of metrological quantum photonics devices and measurements techniques, where an ultra-sensitive radiometer chip directly measures the optical power of photons from a quantum dot single-photon source. This measurement demonstrates the feasibility of implementing optical power measurements of quantum dot sources in system verification and validation of quantum photonics devices in future communications system infrastructure.