Compressed Gate Set Tomography

Characterizing errors in a set of gate operations in quantum devices is a necessary step in assessing their performance. Currently, this task currently handled by gate set tomography which allows us to measure errors while not having to assume perfect state preparation and measurement. However, gate set tomography is computationally expensive, making it viable for only a small number of qubits. Here I will demonstrate a new extension of gate set tomography which borrows techniques from compressed sensing, which I will refer to as compressed gate set tomography. Here, traditional germ design is replaced with a series of short circuits such that the error rates are small. Compressed gate set tomography is capable of fitting error rates in a series of different error models if the errors are sufficiently sparse, which can be enforced through reduced error models, or restricting the errors to low weight. Ultimately, compressed gat set tomography promises an extension to traditional gate set tomography that should be scalable to many qubit systems. SNL is managed and operated by NTESS under DOE NNSA contract DE-NA0003525.