APS Logo

Observation of high out-of-plane tunability and low loss in Ruddlesden-Popper films

ORAL · Invited

Abstract

Microwave circuits like tunable filters and phase shifters rely on high tunability and low loss dielectrics. About a decade ago, scientists observed a record-breaking combination of high in-plane tunability and low loss in strained Ruddlesden-Popper phase BaxSr1-xTiO3 thin films at microwave frequencies. However, most voltage-tunable devices employ out-of-plane geometries, hindering the implementation of Ruddlesden-Popper films in microwave circuits. Still, theory predicts that engineering strainless Ruddlesden-Popper phase BaxSr1-xTiO3 with a high barium content should result in high out-of-plane tunability. Here, we report on measuring this high out-of-plane tunability in Ruddlesden-Popper phase BaxSr1-xTiO3 thin films and show that we can engineer the Ruddlesden-Popper phase to result in low dielectric loss at microwave frequencies. This result shows that Ruddlesden-Popper phase dielectrics can indeed be tunable out-of-plane while retaining their low dielectric loss. Our observations set a new benchmark for low loss out-of-plane tunable microwave dielectrics.

Publication: Low loss out-of-plane ferroelectricity in Ruddlesden-Popper thin films (2025), planned paper

Presenters

  • Florian Bergmann

    National Institute of Standards and Technology, Boulder

Authors

  • Florian Bergmann

    National Institute of Standards and Technology, Boulder

  • Matthew R Barone

    Department of Materials Science and Engineering, Cornell University, Platform for the Accelerated Realization, Analysis, and Discovery of Interface Materials (PARADIM), Cornell University

  • Aiden Ross

    Pennsylvania State University, Penn State University

  • Zishen Tian

    University of California, Berkeley

  • Meagan Papac

    National Institute of Standards and Technology Boulder

  • Samuel Freed

    National Institute of Standards and Technology

  • Darrell G Schlom

    Cornell University, Platform for the Accelerated Realization, Analysis, and Discovery of Interface Materials (PARADIM), Cornell University

  • Nathan D Orloff

    National Institute of Standards and Technology