Imaging topological flat bands of twisted bilayer MoTe<sub>2</sub>
ORAL
Abstract
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Publication: https://arxiv.org/abs/2406.19310
Presenters
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Yufeng Liu
Shanghai Jiao Tong University
Authors
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Yufeng Liu
Shanghai Jiao Tong University
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Yu Gu
Shanghai Jiao Tong University
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Ting Bao
Tsinghua University
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Ning Mao
Max Planck Institute for Chemical Physics of Solids, Max-Planck-Institute for Chemical Physics of Solids
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Can Li
Shanghai Jiao Tong University
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Shudan Jiang
Shanghai Jiao Tong University
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Kenji Watanabe
National Institute for Materials Science, NIMS, Research Center for Functional Materials, National Institute for Materials Science, Research Center for Electronic and Optical Materials, National Institute for Materials Science, 1-1 Namiki, Tsukuba 305-0044, Japan, Research Center for Functional Materials, National Institute of Material Science, Tsukuba, Japan, National Institute of Materials Science, Advanced Materials Laboratory, National Institute for Materials Science
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Takashi Taniguchi
Kyoto Univ
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Wenhui Duan
Tsinghua University
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Jinfeng Jia
Shanghai Jiao Tong Univ
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Xiaoxue Liu
Tsung-Dao Lee Institute and School of Physics and Astronomy, Shanghai Jiao Tong University, Shanghai Jiao Tong University, Tsung-Dao Lee Institute
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Yang Zhang
University of Tennessee
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Tingxin Li
Shanghai Jiao Tong Univ, Shanghai Jiao Tong Univesity
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Shiyong Wang
Shanghai Jiao Tong University