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Progress in Calibration of Graphene-based Josephson Junction Detector for Dark Matter Search

ORAL

Abstract

Graphene-based Josephson junctions have emerged as a promising platform for detecting low-energy events [1] by exploiting the exceptionally low electron heat capacity of graphene and the strong temperature dependence of the junction’s switching current. Recently, we proposed a new strategy for detecting ultra-light dark matter with masses as low as 0.1 keV using graphene-based Josephson junction detectors [2]. In this work, we introduce a detector calibration method that utilizes microwave pulses of varying amplitude for detection efficiency and dark count probability. This calibration technique enables the precise determination of the mass range of dark matter that the detector can detect. In addition, the thermal relaxation time of graphene was also quantitatively analyzed with the two-pulse experiment. This provides information on thermal properties of graphene at low-temperature, which is valuable for optimizing detector performance.

[1] G.-H. Lee, Nature 586, 42 (2020);R. Kokkoniemi, Nature 586, 47 (2020).

[2] D. Kim, arXiv:2002.07821v3 [hep-ph].

Presenters

  • Seunghan Lee

    Pohang Univ of Sci & Tech

Authors

  • Seunghan Lee

    Pohang Univ of Sci & Tech

  • Woochan Jung

    Pohang Univ of Sci & Tech

  • Jeonghyun Seo

    Pohang Univ of Sci & Tech

  • Kenji Watanabe

    National Institute for Materials Science, NIMS, Research Center for Functional Materials, National Institute for Materials Science, Research Center for Electronic and Optical Materials, National Institute for Materials Science, 1-1 Namiki, Tsukuba 305-0044, Japan, Research Center for Functional Materials, National Institute of Material Science, Tsukuba, Japan, National Institute of Materials Science, Advanced Materials Laboratory, National Institute for Materials Science

  • Takashi Taniguchi

    National Institute for Materials Science, International Center for Materials Nanoarchitectonics, National Institute for Materials Science, Research Center for Materials Nanoarchitectonics, National Institute for Materials Science, 1-1 Namiki, Tsukuba 305-0044, Japan, International Center for Materials Nanoarchitectonics, National Institute of Material Science, Tsukuba, Japan, Advanced Materials Laboratory, National Institute for Materials Science

  • Junho Suh

    Pohang University of Science and Technology (POSTECH), Pohang Univ of Sci & Tech

  • Kin Chung Fong

    Raytheon BBN, Raytheon BBN Technologies, Northeastern University

  • Jong-Chul Park

    Chungnam National University

  • Gil-Ho Lee

    Pohang Univ of Sci & Tech, Pohang Univ of Sci & Tech (POSTECH), POSTECH