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Detailed Characterization of Errors in Syndrome Extraction

ORAL

Abstract

Syndrome extraction is a critical component of quantum error correction, and its performance and primary error mechanisms must be understood for high-performance error correction. In this talk, I will introduce methods of estimating detailed Pauli noise models for syndrome extraction circuits. I will discuss top-down approaches using the results of syndrome extraction circuits themselves, and bottom-up approaches that build upon scalable Pauli noise learning methods for gates and mid-circuit measurements. In practice, physical-level operations in quantum processors experience non-stochastic errors, e.g., coherent and weakness errors. I will discuss how these errors affect estimated Pauli error models and how these model inaccuracies affect predictions of the performance of quantum error correction.

Publication: J. Hines and T. Proctor, Pauli Noise Learning for Mid-Circuit Measurements, arXiv:2406.09299

Presenters

  • Jordan Hines

    University of California, Berkeley

Authors

  • Jordan Hines

    University of California, Berkeley

  • Timothy J Proctor

    Sandia National Laboratories

  • Kevin Young

    Sandia National Laboratories