Testing of Cold Electronics for DUNE at UC Irvine

The success of the Deep Underground Neutrino Experiment (DUNE) depends on the reliability of its cold electronics, especially the Analog-to-Digital Converter (ADC) chips that operate in cryogenic environments within the liquid argon time projection chambers (LArTPCs). These chips must maintain stability and performance throughout the multi-decade lifespan of the experiment, enduring temperatures as low as -186°C. Since the cold electronics will become permanently inaccessible once the detector is filled, their long-term reliability is paramount. At UC Irvine, cold quality control (QC) and longevity tests have been conducted to ensure that the ADC chips can reliably perform under these extreme conditions for the entire duration of the experiment. Looking ahead, we anticipate the integration of a new robotic system to automate testing, allowing simultaneous evaluation of multiple chips. This advancement will significantly increase testing throughput and further enhance the reliability of the results.