Radiation Testing of ATLAS Tile Hadronic Calorimeter Low Voltage Power Supply for the Phase II Upgrade

Analysis of radiation testing is an important focus for understanding the robust nature of the electronics for the Phase-II Upgrade of the ATLAS detector. Due to its location, the Low Voltage Power Supplies (LVPS) encounter the largest radiation exposure of all the electronics in the Tile Hadronic Calorimeter. Electronic components of the LVPS, which are manufactured using CMOS, bipolar, or BiCMOS technologies, are scrutinized when exposed to different radiation sources. The radiation tests performed include Total Ionizing Dose (TID), Single Event Effects (SEE), and Non-Ionizing Energy Loss (NIEL). CMOS components are typically the least resilient to TID, while bipolar components are generally prone to displacement damage due to NIEL. Individual and mixed radiation effects on components are explored and mitigation strategies, including circuit re-design and alternative chip selection, are utilized for a robust final design of the LVPS for the HL-LHC era.