Present and Future Extreme Conditions Research at Ultra-Low Emittance Synchrotron Sources and X-ray Free Electron Lasers: Difference and compatibility

With the advent of high energy ultra-low emittance synchrotron sources and X-ray Free Electron Lasers (XFEL), extreme conditions research at high-pressure and high/low temperatures has enter a new realm. While at 3 rd generation sources mostly static high-pressure experiments have been performed, the 4 th generation sources as well as the XFELs will enable the exploration of hierarchical structures both in space and time, making optimal use of the low emittance and even more important the superb coherence of these new sources.

In this presentation we demonstrate the current status of DAC research capabilities at the Extreme Conditions Beamline P02.2 at PETRA III and the HED instrument of the European XFEL. We will highlight the new developments at both facilities and contrast them against each other. Particular emphasized will be the combination of time resolved x-ray diffraction and coherent imaging that has been developed at P02.2 in order to study hierarchies in space and time, which will be the major focus of the Extreme Conditions Time Resolved XRD & Imaging Microscope (ExTReM) at PETRA IV. Thus, ExTReM will combine the unprecedented brilliance and coherence of PETRA IV to perform static (min) to fast (MHz) high-P and high/low-T X-ray diffraction and imaging experiments at high energies to create the ultimate microscope that enables the study of 5 dimensions spanning 6-7 orders of magnitude in time, spatial resolution, and compression rate.