High Energy XRD Measurements in Shock Wave Experiments: A New Capability
ORAL
Abstract
Real-time, in-situ x-ray diffraction (XRD) measurements at the Dynamic Compression Sector (DCS), located at the Advanced Photon Source (APS), constituted a pioneering development in shock wave science. To date, the measurements have been limited to 23 keV x-rays (7 – 23 keV). There is a need to obtain XRD results at significantly higher photon energies to investigate thicker and higher density materials and with higher q-range than currently possible. Toward this goal, we have developed the capability – using a single multi-layer monochromator (SMM) – to isolate x-rays between 7 and 40 keV with approximately 1% bandwidth and > 90% transmission of the peak spectral flux at the highest energies. Experimental data have been successfully obtained at 36 and 40 keV and the same will be presented to show benefits of such results. The broad scientific applicability of this development and how measurements at even higher energy x-rays can be accessed will be discussed.
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Presenters
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Paulo A Rigg
Washington State University
Authors
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Paulo A Rigg
Washington State University
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Yuelin Li
Washington State University, Argonne National Laboratory
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Raymond Conley
Argonne National Laboratory
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Pinaki Das
Washington State University
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Ray Gunawidjaja
Washington State University
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Nicholas Sinclair
Washington State University
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Drew Rickerson
Washington State University
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Yogendra M Gupta
Washington State University