APS Logo

High Energy XRD Measurements in Shock Wave Experiments: A New Capability

ORAL

Abstract

Real-time, in-situ x-ray diffraction (XRD) measurements at the Dynamic Compression Sector (DCS), located at the Advanced Photon Source (APS), constituted a pioneering development in shock wave science. To date, the measurements have been limited to 23 keV x-rays (7 – 23 keV). There is a need to obtain XRD results at significantly higher photon energies to investigate thicker and higher density materials and with higher q-range than currently possible. Toward this goal, we have developed the capability – using a single multi-layer monochromator (SMM) – to isolate x-rays between 7 and 40 keV with approximately 1% bandwidth and > 90% transmission of the peak spectral flux at the highest energies. Experimental data have been successfully obtained at 36 and 40 keV and the same will be presented to show benefits of such results. The broad scientific applicability of this development and how measurements at even higher energy x-rays can be accessed will be discussed.

Presenters

  • Paulo A Rigg

    Washington State University

Authors

  • Paulo A Rigg

    Washington State University

  • Yuelin Li

    Washington State University, Argonne National Laboratory

  • Raymond Conley

    Argonne National Laboratory

  • Pinaki Das

    Washington State University

  • Ray Gunawidjaja

    Washington State University

  • Nicholas Sinclair

    Washington State University

  • Drew Rickerson

    Washington State University

  • Yogendra M Gupta

    Washington State University