Probing exciton dynamics in hybrid perovskites via femtosecond interferometric techniques

Using femtosecond microscopy and interferometric frequency-resolved autocorrelation (IFRAC), we study fundamental light excitations, i.e., excitons, in hybrid organic—inorganic perovskites, novel solution-processed semiconductors for optoelectronic devices. Here, using two identical phase-locked sub-50 fs pulses that are temporally delayed, we excite our sample with micron spatial resolution to study the ultrafast emission properties at both grain interiors and boundaries. By analyzing the interference fringes of the resulting IFRAC trace we can draw conclusions regarding coherent and incoherent emission processes as modified by grain micro-structuring. Our results provide insights to understanding how microstructure modifies the presence of excitons and their stability, critical in dictating device performance.