APS Logo

Processing of high pressure multigrain Laue diffraction data in the High Pressure Collaborative Access Team (HPCAT).

ORAL

Abstract

X-ray Laue diffraction is a powerful tool to investigate mechanisms of pressure induced processes, such as phase transitions and plastic deformation. Studying these mechanisms requires in situ measurements and high-quality fast data collection, while the samples are subject to high pressure (i.e. compressive stress-strain) conditions in a diamond anvil cell (DAC). Studied samples, in general, are multigrain and multiphase containing dozens of crystals having arbitrary orientations. Software PolyLaue, which was developed previously in HPCAT to analyze high pressure Laue data, has been substantially optimized for faster data processing and future adaptation for ML/AI platforms. User friendly graphic user interface (GUI) to manage large Laue diffraction data sets was made by Kitware software developers Patrick Avery and Alessandro Genova. A very powerful routine to map Laue reflections is implemented within the GUI in order to observe changes of the crystals across compression. With the newly developed software, Laue data from dozens of crystals within a multigrain matrix can be analyzed in a matter of days. Case studies will be presented.

Presenters

  • Dmitry Popov

    HPCAT, X-ray Science Division, Argonne National Laboratory, Argonne National Laboratory

Authors

  • Dmitry Popov

    HPCAT, X-ray Science Division, Argonne National Laboratory, Argonne National Laboratory

  • Nenad Velisavljevic

    Lawrence Livermore National Laboratory

  • Patrick Avery

    Kitware

  • Alessandro Genova

    Kitware