MASTERCLASS: Recent developments in advanced synchrotron and optical probes
ORAL · Invited
Abstract
Microscopic structures of materials under extreme environments have been a key focus area in high-pressure science, and X-ray diffraction has been the major technique to probe their complex nature at high temperatures and high pressures. We will provide an overview of the GSECARS facilities (Sector 13, APS) and discuss critical requirements for sample preparation, X-ray diffraction data collection, and analysis. We will describe how one can extract valuable information from their data through a few case examples, followed by a Q&A session. Based on our experience with thousands of users coming to our beamlines, we have established several useful tips and tricks that we will share with students, postdocs, and researchers in the field of high-pressure research that might help them avoid pitfalls and utilize their precious beamtime at large facilities more efficiently. For a comprehensive overview of diamond anvil cell techniques, consider attending both masterclasses, DAC and XRD.
Expected level of knowledge in the area of the attendees: new to this area or looking for updates on advanced techniques and sophisticated methods of analysis
A rough idea of the format: 90-minute session, 2-3 oral presentations + Q&A.
Expected level of knowledge in the area of the attendees: new to this area or looking for updates on advanced techniques and sophisticated methods of analysis
A rough idea of the format: 90-minute session, 2-3 oral presentations + Q&A.
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Presenters
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Stella Chariton
University of Chicago, GSECARS, University of Chicago, Lemont, IL, US
Authors
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Stella Chariton
University of Chicago, GSECARS, University of Chicago, Lemont, IL, US
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Dongzhou Zhang
CARS, University of Chicago, The University of Chicago
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Vitali Prakapenka
University of Chicago, The University of Chicago, GSECARS, University of Chicago, Lemont, IL, US