PolyLaue: a cross-platform open source application for visualizing and analyzing scans of Laue X-ray diffraction image data

Increasingly high collection rates and complexity of x-ray diffraction image data have necessitated more advanced tools for rapid visualization and analysis. As APS-U is commissioned along with other fourth generation light sources, new tools for rapid Laue diffraction analysis have become necessary. Here we present PolyLaue, both a software library and user-friendly graphical user interface (GUI) framework for rapidly visualizing and analyzing scans of Laue diffraction image data. Developed in collaboration between HPCAT and Kitware, PolyLaue enables the rapid identification and tracking of Laue spots from multi-grain and multi-phase crystals during static compression. Designed for visualizing scans of data, the application allows for intuitive visualization and navigation of image data between different scan positions and scan numbers. Interactive peak selection allows for rapid indexing and tracking of Laue spots, which are visualized using predicted reflections overlaid on the images. Maps of regions can be quickly created in order to view regions in all scan positions simultaneously, as well as visualizing and tracking specific reflections during compression. Examples will be demonstrated showcasing its capabilities and ease-of-use.