A study of copper under shock compression using data from the inaugural DiPOLE experiment
ORAL
Abstract
We investigate polycrystalline copper foils under shock compression, presenting X-ray diffraction data obtained during the inaugural DiPOLE-100X experiments at the European XFEL on laser-compressed Kapton-B (50μm) + Copper (25μm) targets [1].
It is well-known that effects due to sample texture, shear stresses, and planar defects (such as stacking faults) contribute to distortions in X-ray diffraction patterns. Previous studies, such as Ref. [2] have used deviations in the (111) and (200) peak positions to predict stacking fault densities in fcc metals under shock.
In this work, we investigate the effects of polycrystalline texture combined with anisotropic elastoplastic singe crystal responses on the overall strain profile of our samples. We demonstrate how this manifests as complexities in the X-ray diffraction patterns produced, and their departures from models of homogeneous stress and strain. Similarly to Ref. [3], we compare our results with a simple, multi-slip crystal plasticity model incorporating inter-grain strain inhomogeneities and their effects on the diffraction patterns. We explore more generally defect-induced changes on individual line profiles and discuss their overall contribution to the X-ray diffraction patterns measured.
It is well-known that effects due to sample texture, shear stresses, and planar defects (such as stacking faults) contribute to distortions in X-ray diffraction patterns. Previous studies, such as Ref. [2] have used deviations in the (111) and (200) peak positions to predict stacking fault densities in fcc metals under shock.
In this work, we investigate the effects of polycrystalline texture combined with anisotropic elastoplastic singe crystal responses on the overall strain profile of our samples. We demonstrate how this manifests as complexities in the X-ray diffraction patterns produced, and their departures from models of homogeneous stress and strain. Similarly to Ref. [3], we compare our results with a simple, multi-slip crystal plasticity model incorporating inter-grain strain inhomogeneities and their effects on the diffraction patterns. We explore more generally defect-induced changes on individual line profiles and discuss their overall contribution to the X-ray diffraction patterns measured.
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Publication: [1] J. Wark et al. arXiv:2501.02940 (2025) <br>[2] Surinder M Sharma et al. Phys. Rev. X 10 (2020).<br>[3] J.M. Foster et al. J. Appl. Phys. 129, 245904 (2021)
Presenters
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Domenic J Peake
University of Oxford
Authors
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Domenic J Peake
University of Oxford
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Patrick G Heighway
University of Oxford
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Thomas Stevens
University of Oxford
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Celine Crepisson
Physics Department University of Oxford, University of Oxford
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Justin S Wark
University of Oxford