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Determination of Layer Number in Graphene using Contrast-Wavelength Relationship via Python Digital Processing

POSTER

Abstract

Graphene continues to be the subject of study due to its physical, electrical, and optical properties. As a Van der Waals material, graphene can be exfoliated and analyzed via cost effective processes. One area of interest is layer number which is the crux of the material properties of the sample and can be found using expensive techniques such as Raman spectroscopy. Here we estimate the layer number of graphene flakes using LEDs and an optical contrast technique. We complete our analysis in Python and compare our results to atomic force microscope measurements.

Presenters

  • Nathanael J Hillyer

    Wentworth Institute of Technology

Authors

  • Nathanael J Hillyer

    Wentworth Institute of Technology

  • Tedi Qafko

    Wentworth Institute of Technology

  • Alexander Norman

    Wentworth Institute of Technology

  • Andrew M Seredinski

    Wentworth Inst of Tech