Determination of Layer Number in Graphene using Contrast-Wavelength Relationship via Python Digital Processing
POSTER
Abstract
Graphene continues to be the subject of study due to its physical, electrical, and optical properties. As a Van der Waals material, graphene can be exfoliated and analyzed via cost effective processes. One area of interest is layer number which is the crux of the material properties of the sample and can be found using expensive techniques such as Raman spectroscopy. Here we estimate the layer number of graphene flakes using LEDs and an optical contrast technique. We complete our analysis in Python and compare our results to atomic force microscope measurements.
Presenters
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Nathanael J Hillyer
Wentworth Institute of Technology
Authors
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Nathanael J Hillyer
Wentworth Institute of Technology
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Tedi Qafko
Wentworth Institute of Technology
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Alexander Norman
Wentworth Institute of Technology
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Andrew M Seredinski
Wentworth Inst of Tech