Characterizing microwave losses in superconducting quantum circuits: Part 2
ORAL
Abstract
The performance of superconducting quantum circuits has advanced tremendously in the past two decades, with coherence times increasing by over six orders of magnitude. In the past, improvements have been made by modifying circuit geometry; recently, improvements have been achieved through advancements in materials and processing. As coherence times continue to rise, it is becoming less apparent which loss mechanisms dominate the total internal loss of transmon qubits and microwave resonators. In this talk, we will demonstrate the power of loss characterization by using multimode stripline resonators to predict and verify the decay times of transmon qubits, and calculate their sensitivity to various sources of loss. In addition, we will discuss a pathway towards optimizing superconducting circuit design to realize on-chip quantum memories with coherence times approaching one millisecond.
–
Presenters
-
Suhas S Ganjam
Yale University
Authors
-
Suhas S Ganjam
Yale University
-
Yanhao Wang
Yale University
-
Yao Lu
Yale University, Yale University Applied Physics Department
-
Archan Banerjee
Yale University
-
Chan U U Lei
Yale University, Quantum Circuits, Inc.
-
Lev Krayzman
Yale University, Princeton University
-
Kim Kisslinger
Brookhaven National Laboratory
-
Chenyu Zhou
Brookhaven National Laboratory, Center for Functional Nanomaterials, Brookhaven National Laboratory, NY, USA, Brookhaven National Lab
-
Yichen Jia
Brookhaven National Laboratory
-
Mingzhao Liu
Brookhaven National Laboratory, Center for Functional Nanomaterials, Brookhaven National Laboratory, NY, USA, Brookhaven National Lab
-
Luigi Frunzio
Yale University
-
Robert J Schoelkopf
Yale University