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Characterizing microwave losses in superconducting quantum circuits: Part 2

ORAL

Abstract

The performance of superconducting quantum circuits has advanced tremendously in the past two decades, with coherence times increasing by over six orders of magnitude. In the past, improvements have been made by modifying circuit geometry; recently, improvements have been achieved through advancements in materials and processing. As coherence times continue to rise, it is becoming less apparent which loss mechanisms dominate the total internal loss of transmon qubits and microwave resonators. In this talk, we will demonstrate the power of loss characterization by using multimode stripline resonators to predict and verify the decay times of transmon qubits, and calculate their sensitivity to various sources of loss. In addition, we will discuss a pathway towards optimizing superconducting circuit design to realize on-chip quantum memories with coherence times approaching one millisecond.

Presenters

  • Suhas S Ganjam

    Yale University

Authors

  • Suhas S Ganjam

    Yale University

  • Yanhao Wang

    Yale University

  • Yao Lu

    Yale University, Yale University Applied Physics Department

  • Archan Banerjee

    Yale University

  • Chan U U Lei

    Yale University, Quantum Circuits, Inc.

  • Lev Krayzman

    Yale University, Princeton University

  • Kim Kisslinger

    Brookhaven National Laboratory

  • Chenyu Zhou

    Brookhaven National Laboratory, Center for Functional Nanomaterials, Brookhaven National Laboratory, NY, USA, Brookhaven National Lab

  • Yichen Jia

    Brookhaven National Laboratory

  • Mingzhao Liu

    Brookhaven National Laboratory, Center for Functional Nanomaterials, Brookhaven National Laboratory, NY, USA, Brookhaven National Lab

  • Luigi Frunzio

    Yale University

  • Robert J Schoelkopf

    Yale University