BE PFM and BE CRF for functional studies of free-standing ferroelectric membranes and thin films
ORAL
Abstract
Classical AFM based tools to study electromechanical phenomena with nanoscale resolution are challenging to be applied on free-standing membranes, due to the mechanical instability of the systems. In this framework, resonant contact modes, such as Contact Resonance Frequency (CRF) and DART Piezoresponse Force Microscopy (DART-PFM), couple to geometrically induced vibrational modes of the suspended membranes and interfere the measurement of piezoelectric properties. Here, I will show on one hand how all the mechanical information of CRF is embedded into the DART-PFM signal. Then, I will discuss the risks, signal artifacts and common experimental concerns arising in this type of measurements and how the application of BE PFM and BE CRF, in a single and multifrequency approach can be applied to overcome the exposed issues. I will show the results obtained on the study of free-standing BaTiO3 membranes with thicknesses in the range of 20 nm to 70 nm with different suspended geometries as well as on corrugated membranes laying on conductive substrates. I will then discuss how the strain and more specifically the strain gradient induced by these geometries impacts on the configuration of ferroelectric domains and enhancement of polarization, and the opportunities this opens to create complex structures with pre-designed functionalities.
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Publication: Manuscript to be submitted
Presenters
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Neus Domingo Marimon
Oak Ridge National Lab
Authors
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Neus Domingo Marimon
Oak Ridge National Lab
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David Pesquera Herrero
Catalan Institute of Nanoscience and Nanotechnology ICN2, Catalan Institute of Nanoscience and Nanotechnology
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Liam Collins
Oak Ridge National Lab
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Kyle Kelley
Oak Ridge National Lab, Oak Ridge National Laboratory
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Stephen Jesse
Oak Ridge National Lab, Oak Ridge National Laboratory, OAK RIDGE NATIONAL LABORATORY
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Marti Checa
Oak Ridge National Lab