Dark field x-ray microscopy for mesoscale phenomena in ordered quantum, structural, and functional materials at modern light sources

Single-crystal diffraction reveals an ‘average’ view of ordered materials; in contrast, dark field x-ray microscopy (DFXM) provides real-space images of mesoscale inhomogeneities that encode spatial information on a Bragg, or a super-lattice (e.g. charge-density wave, magnetic order) peak. In DFXM, a lens magnifies a Bragg peak exiting a sample to form an image. DFXM carried out concurrently with in situ multi-modal measurements can shed light on underlying correlations of materials properties to mesoscale features. Some examples are presented to illustrate the potency of DFXM and introduce cryogenic and associated instrumentation.