Surface Segregation in Fe-Ge Thin Films
POSTER
Abstract
Angle-resolved X-ray photoemission spectroscopy (XPS) has been used to study the surface composition of Fe-Ge thin films. The surfaces of Fe-Ge thin films have not been studied extensively but conclusion here is that under some circumstances, Fe-Ge thin films favor iron segregation to the surface in spite of the larger moment of Fe. A model has been developed to assist in the analysis of the experimental angle-resolved XPS data to construct a more quantitative picture of the surface composition and surface enthalpies. The XPS spectra are indicative of interactions between Ge and Fe arguing against an alloy with strong clustering. Si capping layers have pin-holes that can lead to limited oxidation.
Publication: None at the moment. Research is still ongoing.
Presenters
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Jack L Rodenburg
University of Nebraska - Lincoln, University of Nebraska-Lincoln, University of Nebraska- Lincoln
Authors
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Jack L Rodenburg
University of Nebraska - Lincoln, University of Nebraska-Lincoln, University of Nebraska- Lincoln
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Gauthami Viswan
University of Nebraska - Lincoln
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Mohammad Z Zaz
University of Nebraska - Lincoln, University of Nebraska- Lincoln
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Esha Mishra
University of Nebraska - Lincoln
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Thilini K Ekanayaka
University of Nebraska - Lincoln
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WaiKiat Chin
University of Nebraska - Lincoln
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Peter A Dowben
University of Nebraska - Lincoln
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Robert Streubel
University of Nebraska - Lincoln