Influence of charge noise on foundry-fabricated spin qubit
ORAL
Abstract
However, fluctuating charge traps in the vicinity of QDs have a strong impact on the characteristic of spin qubits by modifying both their static and dynamical properties.
In this context, we present how one can characterize the influence of charge noise on foundry-fabricated devices at low frequency. We will focus on the fluctuation of the electrochemical potential and valley splitting using tunneling spectroscopy and relaxometry at the hotspot respectively.
In a second time, we present analysis of charge noise at high frequency. For this purpose, we have performed dynamical decoupling on a single-electron spin qubit and extract noise power spectral density at large decoupling rate. The obtained PSD indicates that coherence is likely dominated by charge noise and agrees with the extrapolation of low frequency charge noise probed by standard method.
In conclusion, the low amplitude of charge noise measured in these foundry-fabricated structures makes it a good platform toward the realization of high-quality spin-qubits.
[1] Loss, Daniel, and David P. DiVincenzo. "Quantum computation with quantum dots." Physical Review A 57, 120 (1998).
[2] Yoneda, Jun, et al. "A quantum-dot spin qubit with coherence limited by charge noise and fidelity higher than 99.9%." Nature nanotechnology 13, 102 (2018).
[3] Maurand, R., et al. "A CMOS silicon spin qubit." Nature communications 7, 13575 (2016).
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Publication: Spence C. et al. Probing charge noise in few electron CMOS quantum dots ArXiv:2209.01853<br>Klemt B., El-Homsy V. et al. A single-electron spin qubit in a CMOS device In preparation
Presenters
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Matias Urdampilleta
CNRS Institut Néel, Univ. Grenoble Alpes, CNRS, Grenoble INP, Institut Néel, 38402 Grenoble, France, Univ. Grenoble Alpes, CNRS, Grenoble INP, Institut Néel, Univ. Grenoble Alpes, CNRS, Grenoble INP, Institut Néel, Grenoble, France
Authors
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Victor El-Homsy
Univ. Grenoble Alpes, CNRS, Grenoble INP, Institut Néel, 38402 Grenoble, France
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Bernhard Klemt
Université Grenoble Alpes
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Vivien Thiney
Univ. Grenoble Alpes, CNRS, Grenoble INP, Institut Néel, 38402 Grenoble, France, Univ. Grenoble Alpes, CEA, Leti, Grenoble, France
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Renan Lethiecq
Univ. Grenoble Alpes, CNRS, Grenoble INP, Institut Néel, 38402 Grenoble, France, Univ. Grenoble Alpes, CNRS, Grenoble INP, Institut Néel
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Cameron Spence
Univ. Grenoble Alpes, CNRS, Grenoble INP, Institut Néel, 38402 Grenoble, France
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Bruna Cardoso-Paz
Univ. Grenoble Alpes, CNRS, Grenoble INP, Institut Néel, 38402 Grenoble, France
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Emmanuel Chanrion
Institut Neel (CNRS), Univ. Grenoble Alpes, CNRS, Grenoble INP, Institut Néel, Univ. Grenoble Alpes, CNRS, Grenoble INP, Institut Néel, Grenoble, France
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David J Niegemann
Institut Neel, Univ. Grenoble Alpes, CNRS, Grenoble INP, Institut Néel
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Pierre-André A Mortemousque
CEA-Leti, Univ. Grenoble Alpes, CEA, Leti, Grenoble, France
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Baptiste Jadot
Univ. Grenoble Alpes, CEA, Leti, Grenoble, France
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Benoit Bertrand
CEA-Leti, Univ. Grenoble Alpes, CEA, Leti, F-38000 Grenoble, France, CEA LETI, Univ. Grenoble Alpes, CEA, Leti, Grenoble, France
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Heimanu Niebojewski
CEA-Leti, Univ. Grenoble Alpes, CEA, Leti, F-38000 Grenoble, France, Univ. Grenoble Alpes, CEA, Leti, Grenoble, France
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Christopher Bäuerle
Univ. Grenoble Alpes, CNRS, Grenoble INP, Institut Néel, 38402 Grenoble, France, Univ. Grenoble Alpes, CNRS, Grenoble INP, Institut Néel, Grenoble, France
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Maud Vinet
CEA-Leti, Univ. Grenoble Alpes, CEA, Leti, Grenoble, France
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Yann-Michel Niquet
CEA Grenoble, Univ. Grenoble Alpes, CEA, IRIG, 38000 Grenoble, France
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Tristan Meunier
Univ. Grenoble Alpes, CNRS, Grenoble INP, Institut Néel, 38402 Grenoble, France, Univ. Grenoble Alpes, CNRS, Grenoble INP, Institut Néel, Grenoble, France
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Matias Urdampilleta
CNRS Institut Néel, Univ. Grenoble Alpes, CNRS, Grenoble INP, Institut Néel, 38402 Grenoble, France, Univ. Grenoble Alpes, CNRS, Grenoble INP, Institut Néel, Univ. Grenoble Alpes, CNRS, Grenoble INP, Institut Néel, Grenoble, France