Ultrafast characterization of multi-layer MoS<sub>2</sub> on a microdisk resonator
ORAL
Abstract
Two-dimensional (2D) materials like transition metal dichalcogenides have recently emerged as practical active materials for on-chip photonics. Since there are no dangling bonds, these materials are easily integrated into underlying substrates by van der Waals (vdW) forces, which facilitate device fabrication. In this work, we exfoliate multi- and few-layer flakes of MoS2 onto a SiN microdisk resonator. Using ultrafast laser pulses of 50 fs duration and wavelength 800 nm, we photo-excite these MoS2 flakes and monitor the fast modulated response of the resonator. The device exhibits a transient red and blue shift in the resonance wavelength with distinctly different time-scales, which we attribute to the carrier dynamics in the MoS2 flakes.
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Presenters
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Gyan Prakash
Institute for Research in Electronics & Applied Physics, University of Maryland and Laboratory for Physical Sciences, College Park, MD, USA
Authors
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Gyan Prakash
Institute for Research in Electronics & Applied Physics, University of Maryland and Laboratory for Physical Sciences, College Park, MD, USA
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Ramesh Kudalippalliyalil
Institute for Research in Electronics & Applied Physics, University of Maryland and Laboratory for Physical Sciences, College Park, MD, USA
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Karen E Grutter
Laboratory for Physical Sciences, College Park, MD 20740, USA, Laboratory for Physical Sciences
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Thomas E Murphy
Institute for Research in Electronics & Applied Physics University of Maryland, College Park, MD, USA