Direct Detection for Dark Field X-ray Microscopy

The recent development of a US based dark field x-ray microscopy technique has opened up investigation into mesoscopic interactions in a myriad of materials. Even with high efficiency optics, some diffracted signals are often too weak to detect using the current scintillation based methods of imaging. We present here an amorphous-Se detector with small pixel size and high efficiency detection in the hard x-ray energy regime of 15 keV and beyond. Resolution, exposure times and feature detection capabilities are reported and compared against current optical detection methods.