Nb and Re substitutional doping in MoSe<sub>2</sub> monolayer: shallow dopants, defect creation and heterointerfaces
ORAL
Abstract
Here, we report substitutional doping of Nb and Re in MoSe2 monolayer during molecular beam epitaxy (MBE) and the structural properties of heterointerfaces of MoSe2-NbSe2 and MoSe2-ReSe2. Scanning tunneling microscopy and spectroscopy (STM/S) measurements reveal Nb and Re are both shallow energy level dopants, and the Fermi level of the sample can be effectively tuned by controlling doping concentrations. The as-grown n-type pristine MoSe2 deposited on graphene can be doped into p-type by Nb, whereas it becomes more heavily electron-doped by Re. Besides substituting Mo, Nb and Re dopants would introduce mirror twin boundaries (MTBs) of varying character in MoSe2. At the heterointerfaces between MoSe2 and Nb(Re)Se2, dense MTBs are always found when MoSe2 is grown after NbSe2. Sharp interfaces are obtained when MoSe2 growth proceeds NbSe2 deposition. At the interfaces between ReSe2 and MoSe2, mixing of atoms is observed.
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Presenters
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Junqiu Zhang
the University of Hong Kong, The University of Hong Kong
Authors
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Junqiu Zhang
the University of Hong Kong, The University of Hong Kong
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Yipu XIA
The University of Hong Kong
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Zhoubin Yu
Zhejiang University
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Mengfei Yuan
the University of Hong Kong
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Xingyu Yue
The University of Hong Kong, the University of Hong Kong, Department of Physics, the University of Hong Kong, Pokfulam Road, Hong Kong, People's Republic of China
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Yuanjun Jin
the University of Hong Kong
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Yue Feng
SUSTC
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Bin Li
SUSTC
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Bo Wang
Zhejiang University
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Wingkin Ho
the University of Hong Kong, The University of Hong Kong
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Chang Liu
SUSTC
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Hu Xu
SUSTC, Southern University of Science and Technology
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Chuanhong Jin
Zhejiang University
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Maohai Xie
the University of Hong Kong, The University of Hong Kong