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Investigations of Graphene on SrTiO<sub>3</sub> Single-Crystal using Confocal Raman Spectroscopy

ORAL

Abstract

We will present the characterizations of graphene layers placed on SrTiO3 single-crystal substrates using temperature-dependent confocal Raman spectroscopy. This approach successfully resolved distinct Raman modes of graphene that are often untraceable in conventional measurements due to the strong Raman scattering background of SrTiO3. Information on defects and strain states was obtained for a few graphene/SrTiO3 samples that were synthesized by different techniques. This confocal Raman spectroscopic approach can shed light on the investigation of not only this graphene/SrTiO3 system but also various two-dimensional layered materials whose Raman modes interfere with their substrates.

Presenters

  • Ambrose Seo

    University of Kentucky

Authors

  • Sujan Shrestha

    University of Kentucky

  • Celesta S Chang

    Massachusetts Institute of Technology

  • Sangho Lee

    Massachusetts Institute of Technology MIT

  • Matteo Minola

    Max-Planck-Institut für Festkörperforschung, Max Plank Institute for Solid State Research, Max-Planck-Institute for Solid State Research

  • Jeehwan Kim

    Massachusetts Institute of Technology

  • Ambrose Seo

    University of Kentucky