Deep-ultraviolet transient grating for characterizing nanoscale thermal, elastic, and interfacial properties in high-bandgap materials
ORAL
Abstract
The functional properties of complex or nanostructured materials deviate from bulk, due to the increased influence of surfaces and interfaces [1,2]. Characterizing these properties is crucial to designing new, efficient nanoelectronics, energy materials, and quantum technologies. In this work, we demonstrate a deep-ultraviolet (DUV) transient grating to characterize a more general set of materials at smaller length scales than visible-based methods allow. We generate <200nm ultrafast DUV pulses [3] to a excite a sample in a transient grating modality. A transient grating is created by interfering two beams to form a spatially-modulated pattern on the sample surface [4]. The resultant heating causes thermal expansion which launches acoustic waves into the sample, allowing us to study its elastic and thermal properties. The visible transient grating periodicity is limited by the wavelength of the light; however, by using DUV light, we are able to create a smaller period interference pattern down to a few hundred nanometers [5]. Moreover, the DUV pulses are above the bandgap for many visibly-transparent samples, extending our technique to more materials, including diamond and next-generation battery technologies.
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References:
[1] J. Knobloch et al., ACS Appl. Mater. Interfaces 14, 41316 (2022)
[2] A. Beardo et al., ACS Nano 15 (8), 13019 (2021)
[3] J. Ringling, et al., Opt. Lett. 18 (23), 2035 (1993)
[4] J. Rogers et al., Ann. Rev. Mater. Sci. 30, 117 (2000)
[5] A. Maznev et al., Appl. Phys. Lett 113, 221905 (2018)
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References:
[1] J. Knobloch et al., ACS Appl. Mater. Interfaces 14, 41316 (2022)
[2] A. Beardo et al., ACS Nano 15 (8), 13019 (2021)
[3] J. Ringling, et al., Opt. Lett. 18 (23), 2035 (1993)
[4] J. Rogers et al., Ann. Rev. Mater. Sci. 30, 117 (2000)
[5] A. Maznev et al., Appl. Phys. Lett 113, 221905 (2018)
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Presenters
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Emma Nelson
University of Colorado, Boulder
Authors
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Emma Nelson
University of Colorado, Boulder
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Brendan G McBennett
JILA
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Joshua L Knobloch
University of Colorado, Boulder
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Albert Beardo
Department of Physics, JILA, and STROBE NSF Science & Technology Center, University of Colorado and NIST, Boulder, Colorado 80309, USA, University of Colorado, JILA, STROBE, JILA
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Henry C Kapteyn
University of Colorado, Boulder, University of Colorado, JILA, University of Colorado, Boulder
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Margaret M Murnane
JILA, JILA, University of Colorado, Boulder