Intrinsic exchange bias from interfacial reconstruction in NiCo<sub>2</sub>O<sub>4</sub>/Al<sub>2</sub>O<sub>3</sub> thin films
ORAL
Abstract
Exchange bias that occurs from a magnetic/non-magnetic interface, called intrinsic exchange bias, is an intriguing topic for the nominal simplicity and potential applications. We have studied the epitaxial NiCo2O4 (111) films grown on Al2O3 (0001) substrates and discovered intrinsic exchange bias up to ≈ 1 kOe; the magnetization can even be pinned along only one direction. Thickness-resolved reflection high energy electron diffraction (RHEED) indicates an interfacial reconstruction that mimics CoO, which can serve as the antiferromagnetic layer for the exchange bias. The thickness of the interfacial layer is sensitive to the O2 background pressure of the thin film growth, which in turn changes the exchange bias. These results suggest highly tunable interfacial structures and magnetic properties in NiCo2O4 films.
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Presenters
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Xiaoshan Xu
University of Nebraska - Lincoln, Department of Physics and Astronomy and the Nebraska Center for Materials and Nanoscience, University of Nebraska-Lincoln
Authors
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Xiaoshan Xu
University of Nebraska - Lincoln, Department of Physics and Astronomy and the Nebraska Center for Materials and Nanoscience, University of Nebraska-Lincoln
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Detian Yang
University of Nebraska - Lincoln, University of Nebraska-Lincoln