Understanding the role of defects in nanoscale patterning in graphene
ORAL
Abstract
Graphene’s unique intrinsic properties have been great interests, and atomic scale modification of graphene is expected to control over its properties through geometric and strain effects. The focused beam of a scanning transmission electron microscope (STEM) was used in manipulating graphene atoms in an atomic scale. To understand graphene healing and the diffusion of defects, competing processes in graphene milling, we performed classical molecule dynamics simulations at various temperatures and revealed dynamics of the processes.
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Publication: Dyck, O., Yeom, S., Dillender, S., Lupini, A.R., Yoon, M. and Jesse, S., 2023. The role of temperature on defect diffusion and nanoscale patterning in graphene. Carbon, 201, pp.212-221.
Presenters
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Sinchul Yeom
Oak Ridge National Laboratory
Authors
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Sinchul Yeom
Oak Ridge National Laboratory
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Ondrej Dyck
Oak Ridge National Laboratory
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Mina Yoon
Oak Ridge National Lab
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Andrew R Lupini
Oak Ridge National Lab
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Stephen Jesse
Oak Ridge National Lab, Oak Ridge National Laboratory, OAK RIDGE NATIONAL LABORATORY