Imaging the polarization state in few-layer 3R-MoS<sub>2</sub> with Kelvin Probe Force Microscopy
ORAL
Abstract
Recently, rhombohedral-stacked (R-stacked) transition metal dichalcogenides (TMDs) have attracted much attention due to the novel ferroelectricity phenomenon occurring at their interfaces which can potentially be used in memory and optoelectronic devices. Since the spontaneous polarization direction is governed by stacking orders, a bilayer R-stacked TMD can be switched between two opposite polarization states. On the other hand, the polarization state in a thicker flake can be interesting as more than one interface is involved. Here we probe the polarization state by imaging the surface potential in few-layer 3R-MoS2 flakes with Kelvin Probe Force Microscopy (KPFM). We find that multiple polarization states induced by different stacking configurations can coexist in a flake. Furthermore, the substrate doping can contribute to distinguishing those ideally degenerate polarization states. In all, our results reveal the stacking disorder in few-layer R-stacked MoS2 flakes.
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Presenters
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Jing Liang
The University of British Columbia, University of British Columbia
Authors
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Jing Liang
The University of British Columbia, University of British Columbia
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Dongyang Yang
University of British Columbia, University of British Coloumbia
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Yunhuan Xiao
University of British Columbia
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Sean Chen
University of British Columbia
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Jerry I Dadap
University of British Columbia
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Joerg Rottler
University of British Columbia
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Ziliang Ye
University of British Columbia