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Quantum dot arrays in linear and two-dimension geometries in silicon

ORAL

Abstract

The performance of quantum computers can be traced back to the quality of quantum devices. Quantum states are fragile and may lose their state due to decoherence caused by a noisy environment [1,2,3]. The growth of low defect, and low disorder materials and reliable device fabrication is required. In this work, we report on state-of-the-art fabrication methods of spin qubit devices that are defined in isotopically purified in-house grown 28Si/SiGe heterostructures. We report developments in the fabrication process of two-dimensional quantum dot arrays in 28Si/SiGe heterostructures as a promising way forward for scaling up [4]. Such a device architecture also allows for tunnel coupling between two adjacent quantum dots in two-dimensions. Furthermore, scalable quantum processor might also require the use of shared plunger and barrier gates as has been demonstrated in the Ge/SiGe material platform [5], which entails very high level of device uniformity in terms of control voltages required per qubit. Here, we also report on fabrication process of linear quantum dot array devices that were used to demonstrate the electrical tuning of plunger gates to achieve higher degree of electrical uniformity, thereby significantly reducing variations in the turn-on voltages [6].

[1] Zwanenburg et al., Rev. Mod. Phys. 85, 961 (2013).

[2] Nicollian and Brews, MOS (Metal Oxide Semiconductor) Physics and Technology, (John Wiley & Sons, New York, 1982).

[3] Wuetz et al., arXiv: arXiv:2209.07242.

[4] Vandersypen et al., npj Quantum Inf 3, 34 (2017).

[5] Borsoi et al., arXiv:2209.06609.

[6] Meyer et al. (to be submitted)

Presenters

  • Saurabh Karwal

    TNO, Qutech, Netherlands Organisation for Applied Scientific Research (TNO), TNO/QuTech

Authors

  • Saurabh Karwal

    TNO, Qutech, Netherlands Organisation for Applied Scientific Research (TNO), TNO/QuTech

  • Sergey V Amitonov

    TNO, Qutech, QuTech and TNO, Stieltjesweg 1, 2628 CK Delft, The Netherlands, QuTech and Netherlands Organization for Applied Scientific Research (TNO), Delft, The Netherlands, TNO, QuTech, TNO, TNO/QuTech

  • Larysa Tryputen

    TNO, Qutech, Netherlands Organisation for Applied Scientific Research (TNO), QuTech and Netherlands Organization for Applied Scientific Research (TNO), Delft, The Netherlands, TNO, TNO/QuTech, TNO Netherlands Organization for Applied Scientific Research

  • Amir Sammak

    TNO, Qutech, QuTech and TNO, Stieltjesweg 1, 2628 CK Delft, The Netherlands, Netherlands Organisation for Applied Scientific Research (TNO), QuTech and Netherlands Organization for Applied Scientific Research (TNO), Delft, The Netherlands, TNO, QuTech, TNO, Netherlands Organization for Applied Scientific Research (TNO), QuTech and Netherlands Organisation for Applied Scientific Research (TNO), Stieltjesweg 1, 2628 CK Delft, The Netherlands, TNO/QuTech

  • David J Michalak

    TNO/QuTech, TNO, QuTech

  • Marcel Meyer

    Delft University of Technology

  • Florian K Unseld

    Delft University of Technology

  • Corentin Déprez

    Delft University of Technology

  • Timo v Abswoude

    Delft University of Technology

  • Lieven M Vandersypen

    Delft University of Technology, QuTech and the Kavli Institute of Nanoscience, Delft University of Technology

  • Giordano Scappucci

    QuTech and Kavli Institute of Nanoscience, TU Delft, P.O. Box 5046, 2600 GA Delft, The Netherlands, Delft University of Technology, QuTech and the Kavli Institute of Nanoscience, Delft University of Technology, TU Delft QuTech, QuTech and Kavli Institute of Nanoscience, Delft University of Technology, P.O. Box 5046, 2600 GA Delft, The Netherlands

  • Menno Veldhorst

    Delft University of Technology, QuTech and Kavli Institute of Nanoscience, Delft University of Technology, P.O. Box 5046, 2600 GA Delft, The Netherlands