Scanning multiprobe microscopy

Scanning probe microscopy (SPM) techniques broadly fit into two paradigms: scanning tip-based methods and scanning chip-based methods. Tip-based architectures can facilitate exceptionally close tip-sample distances enabling high spatial and signal resolution. However, few sensors can be implemented this way. Chip-based approaches allow for a broader variety of more intricate sensors (or ensembles thereof) with stricter limitations on sensor-sample distances. In this talk, I will discuss the development of a new SPM paradigm-scanning multiprobe microscopy-that marries the broad functional possibilities of chip-based SPM and the exceptionally small sensor-sample distances of tip-based techniques. This multiprobe microscope permits simultaneous operation of several arbitrary mesoscopic probes and is wafer-scale compatible. I will highlight relevance to open questions in condensed matter physics and quantum information science.