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Superconducting diode effect in InSb nanowires with Tin shell

ORAL

Abstract

We study Josephson Junction in InSb nanowires with 15nm Tin shells. We observe critical current diffraction patterns skewed and inversion-symmetric in magnetic field and bias direction. The effect is stronger when the external magnetic field is aligned perpendicular to the nanowire, in the substrate plane. i.e. in the most likely direction of the effective spin-orbit field in the junction. The effect is also tunable by gate voltage. We discuss this effect in the context of phi0-Josephson junction physics, one consequence of which is known in recent literature as superconducting diode effect. We consider alternative explanations such as the effective magnetic field and perform numerical simulations to understand our findings.

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Presenters

  • Bomin Zhang

    University of Pittsburgh

Authors

  • Bomin Zhang

    University of Pittsburgh

  • Victor Aguilar

    Michigan State University

  • Po Zhang

    University of Pittsburgh

  • Mihir Pendharkar

    Stanford Univ, Stanford University

  • Connor P Dempsey

    University of California, Santa Barbara, Electrical and Computer Engineering, University of California Santa Barbara, Santa Barbara, California 93106, USA, University of California in Santa Barbara, University of California Santa Barbara

  • Joon Sue Lee

    University of Tennessee, University of Tennessee Knoxville

  • Sean Harrington

    University of California, Santa Barbara

  • Ghada Badawy

    Eindhoven University of Technology

  • Sasa Gazibegovic

    Eindhoven University of Technology

  • Jason Jung

    Eindhoven University of Technology

  • An-Hsi Chen

    University of Grenoble Alpes, Université Grenoble Alpes, Institut Néel CNRS

  • Susheng Tan

    University of Pittsburgh

  • Marcel Verheijen

    Eindhoven University of Technology, Eurofins Materials Science B.V.

  • Moira Hocevar

    University of Grenoble Alpes, Université Grenoble Alpes, Institut Néel CNRS, Universite Grenoble Alpes

  • Erik P. A. M. Bakkers

    Eindhoven University of Technology

  • Chris J Palmstrom

    University of California, Santa Barbara

  • Sergey M Frolov

    University of Pittsburgh