Towards millimeter-wave standards for dielectrics and loss tangent

In this talk, I will introduce the National Institute of Standards and Technology’s (NIST) microwave materials program. I will introduce our new effort to develop traceable mmWave standard reference materials. I will discuss how this new standard will impact on-wafer calibration standards, traceable power, phase and impedance. I plan to briefly discuss cavity perturbation theory, which is a method that’s easy and inexpensive to do. Having introduced NIST’s goals, I will provide a list of essential equipment needed to perform the on-wafer calibrations. After laying out our program at NIST and some of our recent accomplishments, I want to open the conversation and answer your questions about microwave measurements.