Single Atom X-ray Spectroscopy using Synchrotron X-rays Scanning Tunneling Microscopy
ORAL
Abstract
[1] V. Rose, N. Shirato, M. Bartlein, A. Deriy, T. Ajayi, D. Rosenmann, S.-W. Hla, M. Fisher, and R. Reininger. XTIP – the world's first beamline dedicated to the synchrotron X-ray scanning tunneling microscopy technique. J. Synchrotron Rad. 27, 836-843 (2020).
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Presenters
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Tolulope Michael M Ajayi
Ohio University, Ohio University & Argonne National Laboratory
Authors
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Saw W Hla
Nanoscale and Quantum Phenomena Institute, Physics & Astronomy Department, Ohio University, Athens, Ohio 45701, United States, Center for Nanoscale Materials, ANL, IL, USA, Center for Nanoscale Materials, Argonne National Laboratory, Lemont, Illinois 60439, United States, Ohio University, Ohio University and Argonne National Laboratory, Ohio University & Argonne National Laboratory
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Tolulope Michael M Ajayi
Ohio University, Ohio University & Argonne National Laboratory
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Daniel J Trainer
Center for Nanoscale Materials, Argonne National Laboratory, Lemont, Illinois 60439, United States, Argonne National Laboratory, Temple University
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Sanjoy Sarkar
Ohio University, Department of Physics & Astronomy, Ohio University
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Nozomi Shirato
Argonne National Laborato
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Daniel Rosenmann
Argonne National Laboratory, Center for Nanomaterials, Argonne National Laboratory, Argonne, Illinois 60439
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Shaoze Wang
Ohio University, Ohio University & Argonne National Laboratory, Physics & Astronomy Department, Ohio University & Argonne National Laboratory
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Volker Rose
Argonne National Laboratory