Industrial and Applied Transmission Electron Microscopy
INVITED · S13 · ID: 24074
Presentations
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Probing atomic reconstruction at 2D interfaces via scanning transmission electron microscopy
ORAL · Invited
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Publication: [1] E. Han et al., Nature Materials 19, 305-310 (2020).<br>[2] J. Yu et al., Advanced Materials 33, 2007269 (2021).
Presenters
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Pinshane Y Huang
University of Illinois at Urbana-Champaign, University of Illinois at Urbana-Champai
Authors
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Pinshane Y Huang
University of Illinois at Urbana-Champaign, University of Illinois at Urbana-Champai
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Exploiting automatic image processing and in-situ transmission electron microscopy to understand the stability of supported nanoparticles
ORAL · Invited
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Presenters
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Eric Stach
University of Pennsylvania
Authors
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Eric Stach
University of Pennsylvania
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Electron Spectroscopy of Infrared Excitations at the Nanoscale
ORAL · Invited
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Presenters
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Maureen Lagos
McMaster University
Authors
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Maureen Lagos
McMaster University
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Nanoscale Analysis of Phonons, Polaritons, and Molecular Vibrations in Complex Materials
ORAL · Invited
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Presenters
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Jordan Hachtel
Oak Ridge National Lab
Authors
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Jordan Hachtel
Oak Ridge National Lab
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From the Atomic Structure to the Optoelectronic Properties Studies of 1D and 2D Complex Nanostructures via TEM
ORAL · Invited
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Presenters
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Raul Arenal
Universidad de Zaragoza
Authors
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Raul Arenal
Universidad de Zaragoza
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