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Electron Microscopy Imaging and Spectroscopy of 2D Materials

FOCUS · Q60 · ID: 48401






Presentations

  • Picometer-scale characterization of structure, strain and defects in 2D materials using 4D-STEM

    ORAL · Invited

    Publication: [1] Y. Jiang, Z. Chen, Y. Han, P. Deb, H. Gao, S. Xie, P. Purohit, M. W. Tate, J. Park, S. M. Gruner, V. Elser, and D. A. Muller. "Electron Ptychography of 2D Materials to Deep Sub-Ångström Resolution" Nature 559, (2018): 343–349. <br>[2] Z. Chen, Z., Y. Jiang, Y.-T. Shao, M. E. Holtz, M. Odstrčil, M. Guizar-Sicairos, I. Hanke, S. Ganschow, D. G. Schlom, and D. A. Muller. "Electron Ptychography Achieves Atomic-Resolution Limits Set by Lattice Vibrations" Science 372, (2021), 826–831.

    Presenters

    • David A Muller

      Cornell University, School of Applied and Engineering Physics, Cornell University

    Authors

    • David A Muller

      Cornell University, School of Applied and Engineering Physics, Cornell University

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  • Visualizing lattice relaxation and strain fields in twisted bilayer graphene

    ORAL

    Publication: N.P. Kazmierczak, M. Van Winkle, C. Ophus, K.C. Bustillo, S. Carr, H.G. Brown, J. Ciston, T. Taniguchi, K. Watanabe, and D.K. Bediako, Nat. Mater. 20, 953–963 (2021).

    Presenters

    • Madeline Van Winkle

      University of California, Berkeley

    Authors

    • Madeline Van Winkle

      University of California, Berkeley

    • Daniel K Bediako

      University of California, Berkeley, University of California Berkeley

    • Nathanael P Kazmierczak

      California Institute of Technology

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  • Identifying Single-Atom Defects of 2D Materials on the Million-Atom Scale via Deep Learning

    ORAL

    Publication: 1. C.-H. Lee et al., Microscopy and Microanalysis 27 S1 (2021), p. 904-906<br>2. C.-H. Lee et al., Nano Letters 20 (2020), p. 3369-3377

    Presenters

    • Chia-Hao Lee

      University of Illinois at Urbana-Champaign

    Authors

    • Chia-Hao Lee

      University of Illinois at Urbana-Champaign

    • Abid A Khan

      University of Illinois at Urbana-Champai, University of Illinois at Urbana-Champaign

    • Di Luo

      Massachusetts Institute of Technology, University of Illinois at Urbana-Champaign

    • Chuqiao Shi

      Rice University

    • Yue Zhang

      University of Illinois at Urbana-Champaign, University of Illinois at Urbana Champaign

    • M. Abir Hossain

      University of Illinois at Urbana-Champaign

    • Arend M van der Zande

      University of Illinois at Urbana-Champaign, University of Illinois at Urbana Champaign

    • Bryan K Clark

      University of Illinois at Urbana-Champaign

    • Pinshane Y Huang

      University of Illinois at Urbana-Champaign, University of Illinois at Urbana-Champai

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  • Using Cycle-GANS to Generate Realistic STEM Images for Defect Identification

    ORAL

    Presenters

    • Abid A Khan

      University of Illinois at Urbana-Champai, University of Illinois at Urbana-Champaign

    Authors

    • Abid A Khan

      University of Illinois at Urbana-Champai, University of Illinois at Urbana-Champaign

    • Chia-Hao Lee

      University of Illinois at Urbana-Champaign

    • Pinshane Y Huang

      University of Illinois at Urbana-Champaign, University of Illinois at Urbana-Champai

    • Bryan K Clark

      University of Illinois at Urbana-Champaign

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  • Structural transformations creating atomistic spin textures on-demand in the van der Waals layered magnet CrSBr

    ORAL

    Publication: https://arxiv.org/abs/2107.00037

    Presenters

    • Thang Pham

      Massachusetts Institute of Technology (MIT)

    Authors

    • Thang Pham

      Massachusetts Institute of Technology (MIT)

    • Julian Klein

      Massachusetts Institute of Technology

    • Joachim Thomsen

      Massachusetts Institute of Technology

    • Jan Luxa

      University of Chemistry and Technology Prague

    • Zdenek Sofer

      University of Chemistry and Technology Prague

    • Frances Ross

      Massachusetts Institute of Technology, Massachusetts Institute of Technology MIT

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  • Atomic-resolution imaging and characterization of ferroelectric domain walls in two-dimensional In<sub>2</sub>Se<sub>3</sub>

    ORAL

    Presenters

    • Edmund Han

      University of Illinois at Urbana-Champaign

    Authors

    • Edmund Han

      University of Illinois at Urbana-Champaign

    • Shahriar M Nahid

      University of Illinois at Urbana-Champaign

    • Yue Zhang

      University of Illinois at Urbana-Champaign, University of Illinois at Urbana Champaign

    • Tawfiqur Rakib

      University of Illinois at Urbana-Champaign

    • Gillian Nolan

      University of Illinois at Urbana-Champaign

    • Andre Schleife

      University of Illinois at Urbana-Champai, University of Illinois at Urbana-Champaign

    • Elif Ertekin

      University of Illinois at Urbana-Champaign, University of Illinois at Urbana-Champai, U Illinois

    • SungWoo Nam

      University of California - Irvine

    • Arend M van der Zande

      University of Illinois at Urbana-Champaign, University of Illinois at Urbana Champaign

    • Pinshane Y Huang

      University of Illinois at Urbana-Champaign, University of Illinois at Urbana-Champai

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  • Atomically resolved phonons localized at defects in monolayer graphene

    ORAL

    Presenters

    • Deliang Bao

      Vanderbilt Univ, Vanderbilt University

    Authors

    • Deliang Bao

      Vanderbilt Univ, Vanderbilt University

    • Mingquan Xu

      University of Chinese Academy of Sciences

    • Aowen Li

      University of Chinese Academy of Sciences

    • Stephen J Pennycook

      Natl Univ of Singapore

    • Sokrates T Pantelides

      Vanderbilt Univ, Department of Physics and Astronomy and Department of Electrical and Computer Engineering, Vanderbilt University, Nashville, TN 37235, USA, Department of Physics, Vanderbilt University, Department of Physics and Astronomy and Department of Electrical and Computer Engineering, Vanderbilt University, Nashville, TN

    • Wu Zhou

      University of Chinese Academy of Sciences

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  • Spin−orbit induced magnetic modulation at the V<sub>5</sub>Se<sub>8</sub> / NbSe<sub>2</sub> van der Waals heterostructures

    ORAL

    Publication: Matsuoka, H. et al. Nano Lett. 21, 1807–1814 (2021).

    Presenters

    • Hideki Matsuoka

      RIKEN

    Authors

    • Hideki Matsuoka

      RIKEN

    • Masaki Nakano

      The University of Tokyo

    • Stewart E Barnes

      Univ of Miami

    • Jun'ichi Ieda

      JAEA

    • Sadamichi Maekawa

      RIKEN, Tohoku Univ

    • Mohammad S Bahramy

      The University of Manchester

    • Bruno S Kenichi

      Department of Applied Physics, University of Tokyo, The University of Tokyo

    • Yukiharu Takeda

      JAEA

    • Hiroki Wadati

      Univ of Hyogo

    • Yue Wang

      the University of Tokyo

    • Satoshi Yoshida

      the University of Tokyo

    • Kyoko Ishizaka

      Department of Applied Physics, University of Tokyo, the Univeristy of Tokyo

    • Yoshihiro Iwasa

      Univ of Tokyo

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  • Investigation of van der Waals antiferromagnet MnPS<sub>3</sub> using X-ray Magnetic Linear Dichroism (XMLD).

    ORAL

    Presenters

    • Tianye Wang

      University of California, Berkeley, Lawrence Berkeley National Laboratory

    Authors

    • Tianye Wang

      University of California, Berkeley, Lawrence Berkeley National Laboratory

    • Qian Li

      University of Science and Technology of China

    • Mengmeng Yang

      Anhui University

    • Christoph Klewe

      Advanced Light Source, Lawrence Berkeley National Laboratory

    • Padraic Shafer

      Advanced Light Source, Lawrence Berkeley National Laboratory, Advanced Light Source, Lawrence Berkeley National Lab, Advanced Light Source, Lawrence Berkeley National Laboratory

    • Alpha T N'Diaye

      Lawrence Berkeley National Laboratory, Lawrence Berkeley National Lab, Advanced Light Source, Lawrence Berkeley National Lab

    • Chanyong Hwang

      Korea Research Inst of Standards and Sci, Korea Research Inst of Standards and Science (KRISS)

    • Zi Q. Qiu

      University of California, Berkeley

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