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Microscopy 1: Electrons, THz, Optical

FOCUS · Q31 · ID: 48276

Presentations

  • Mapping conductivity with secondary electron EBIC in a STEM

    ORAL

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    Publication: O. Dyck, J. L. Swett, A. R. Lupini, J. A. Mol, and S. Jesse, "Imaging Secondary Electron Emission from a Single Atomic Layer," Small Methods, vol. 5, no. 4, p. 2000950, 2021, doi: 10.1002/smtd.202000950.<br>O. Dyck, J. L. Swett, C. Evangeli, A. R. Lupini, J. A. Mol, and S. Jesse, Mapping Conductance and Switching Behavior of Graphene Devices In Situ, Small Methods (under review)<br>O. Dyck, J. L. Swett, C. Evangeli, A. R. Lupini, J. A. Mol, and S. Jesse, Contrast mechanisms in secondary electron e-beam induced current (SEEBIC) imaging, (in progress)

    Presenters

    • Ondrej Dyck

      ORNL, Oak Ridge National Laboratory, Oak Ridge National Lab

    Authors

    • Ondrej Dyck

      ORNL, Oak Ridge National Laboratory, Oak Ridge National Lab

    • Jacob Swett

      ASU, Arizona State University

    • Charalambos Evangeli

      Oxford University

    • Andrew R Lupini

      Oak Ridge National Lab

    • Jan Mol

      Queen Mary University of London

    • Stephen Jesse

      Oak Ridge National Laboratory, University of Tennessee

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  • Enhancing Symmetry Breaking Defects in Materials with a STEM Phase Plate

    ORAL

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    Presenters

    • Stephanie M Ribet

      Department of Materials Science and Engineering, Northwestern University; International Institute of Nanotechnology, Northwestern University, Northwestern University

    Authors

    • Stephanie M Ribet

      Department of Materials Science and Engineering, Northwestern University; International Institute of Nanotechnology, Northwestern University, Northwestern University

    • Colin L Ophus

      National Center for Electron Microscopy, Molecular Foundry, Lawrence Berkeley National Laboratory, Lawrence Berkeley National Laboratory

    • Vinayak P Dravid

      Northwestern University, Department of Materials Science and Engineering, Northwestern University; International Institute of Nanotechnology, Northwestern University; NUANCE Center, Northwestern U.

    • Roberto dos Reis

      Department of Materials Science and Engineering, Northwestern University; NUANCE Center, Northwestern University, Northwestern University

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  • Kinetic and thermodynamic measurements of the crystallization of phase change materials using transmission electron microscopy and nanocalorimetry

    ORAL

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    Publication: Isak McGieson, Victoriea L. Bird, Christopher M. Barr, Khalid Hattar, Bryan W. Reed, Joseph T. McKeown, Feng Yi, David A. LaVan, and M. K. Santala. <br>"Crystallization kinetics and thermodynamics of an Ag-In-Sb-Te phase change material using complementary in-situ microscopic techniques". <br>In: Journal of Materials Research (2021). submitted invited paper.

    Presenters

    • Isak McGieson

      Oregon State University

    Authors

    • Isak McGieson

      Oregon State University

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  • Atomic scale direct-write dopant patterning on graphene

    ORAL

    –

    Presenters

    • Andrew R Lupini

      Oak Ridge National Lab

    Authors

    • Andrew R Lupini

      Oak Ridge National Lab

    • Ondrej Dyck

      ORNL, Oak Ridge National Laboratory, Oak Ridge National Lab

    • Mina Yoon

      Oak Ridge National Lab

    • Sergei V Kalinin

      Oak Ridge National Lab, Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge National Laboratory

    • Jacob Swett

      ASU, Arizona State University

    • Stephen Jesse

      Oak Ridge National Laboratory, University of Tennessee

    View abstract →

  • Traceable localization in optical microscopy

    ORAL

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    Publication: arXiv:2106.10221

    Presenters

    • Craig R Copeland

      NIST, National Institute of Standards and Technology

    Authors

    • Craig R Copeland

      NIST, National Institute of Standards and Technology

    • Ronald G Dixson

      National Institute of Standards and Technology

    • Andrew C Madison

      National Institute of Standards and Tech

    • Adam L Pintar

      National Institute of Standards and Technology

    • B. Rob Ilic

      National Institute of Standards and Technology

    • Samuel M Stavis

      National Institute of Standards and Technology

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  • Rapid simulations of hyperspectral near-field images of three-dimensional heterogeneous surfaces

    ORAL

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    Publication: Chen, Xinzhong, et al. "Rapid simulations of hyperspectral near-field images of three-dimensional heterogeneous surfaces." accepted by Opt. Express

    Presenters

    • Ziheng Yao

      State Univ of NY - Stony Brook, Stony Brook University (SUNY)

    Authors

    • Xinzhong Chen

      Stony Brook University (SUNY), State Univ of NY - Stony Brook

    • Ziheng Yao

      State Univ of NY - Stony Brook, Stony Brook University (SUNY)

    • Stefan G Stanciu

      Politehnica University of Bucharest

    • Dmitri N Basov

      Columbia University

    • Rainer Hillenbrand

      CIC nanoGUNE

    • Mengkun Liu

      State Univ of NY - Stony Brook

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  • Development of Image Corrections for Photoemission Electron Microscopy (PEEM) and its Application to Graphene

    ORAL

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    Publication: "Imaging and Measuring the Electronic Properties of Epitaxial Graphene with a Photoemission Electron Microscopy" <br>by Falk Niefind, Henry Bell, Thuc Mai, Angela Hight Walker, Randolph Elmquist, and Sujitra Pookpanratana (under review)

    Presenters

    • Henry Bell

      National Institute of Standards and Technology and University of Maryland, National Institute of Standards and Technology and Macalester College

    Authors

    • Henry Bell

      National Institute of Standards and Technology and University of Maryland, National Institute of Standards and Technology and Macalester College

    • Falk Niefind

      National Institute of Standards and Technology and University of Maryland, National Institute of Standards and Technology and University of Maryland College Park

    • Randolph E Elmquist

      National Institute of Standards and Technology

    • Sujitra Pookpanratana

      National Institute of Standards and Tech

    View abstract →

  • Reconstruction of Nano-Plasmonic Excitations Using Ultrafast Transmission Electron Microscopy

    ORAL

    –

    Presenters

    • John H Gaida

      Max Planck Institute for Biophysical Chemistry and 4th Physical Institute, University of Göttingen, 37077 Göttingen, Germany

    Authors

    • John H Gaida

      Max Planck Institute for Biophysical Chemistry and 4th Physical Institute, University of Göttingen, 37077 Göttingen, Germany

    • Hugo Lourenço-Martins

      Max Planck Institute for Biophysical Chemistry and 4th Physical Institute, University of Göttingen, 37077 Göttingen, Germany

    • Sergey Yalunin

      Max Planck Institute for Biophysical Chemistry and 4th Physical Institute, University of Göttingen, 37077 Göttingen, Germany

    • Armin Feist

      Max Planck Institute for Biophysical Chemistry and 4th Physical Institute, University of Göttingen, 37077 Göttingen, Germany

    • Murat Sivis

      Max Planck Institute for Biophysical Chemistry and 4th Physical Institute, University of Göttingen, 37077 Göttingen, Germany

    • Thorsten Hohage

      Institute of Numerical and Applied Mathematics, University of Göttingen, 37083 Göttingen, Germany

    • F. Javier García de Abajo

      ICFO-Institut de Ciencies Fotoniques and ICREA-Institució Catalana de Recerca i Estudis Avançats, Barcelona, Spain

    • Claus Ropers

      Max Planck Institute for Biophysical Chemistry and 4th Physical Institute, University of Göttingen, 37077 Göttingen, Germany

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  • A scanning NV center magnetometry probe fabricated by a focused ion beam

    ORAL

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    Presenters

    • Yuta Kainuma

      Japan Advanced Institute of Science and Technology

    Authors

    • Yuta Kainuma

      Japan Advanced Institute of Science and Technology

    • Aoi Ideguchi

      Japan Advanced Institute of Science and Technology

    • Kunitaka Hayashi

      Japan Advanced Institute of Science and Technology

    • Toshu An

      Japan Advanced Institute of Science and Technology

    View abstract →